IngEl-701:
Digital Microelectronics and Applications
| Unit III: Advanced Concepts in IC Design |
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OBJECTIVE:
Upon completion of this unit, the student will have acquired knowledge about advanced digital IC technologies, system components, testing procedures, and noise sources in digital ICs.
Upon completion of this unit, the student will have acquired knowledge about advanced digital IC technologies, system components, testing procedures, and noise sources in digital ICs.
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7. BiCMOS Circuits
(Addendum B)
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7.1 The BiCMOS Concept
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7.2 DC Behavior of
BiCMOS Inverter
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7.3 Dynamic Performance
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7.4 BiCMOS Gate Design
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8. Synchronous
Components in IC Design (Chapter 7)
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8.1 General Concepts
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8.2 Latches and Registers
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8.3 Concepts on Pipelining
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8.4 Other Regenerative Circuits
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9. Integrated
Memories (Chapter 12)
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9.1 Introductory
Concepts
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9.2 Memory Types
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9.3 Memory Circuitry
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9.4 Performance: Timing and Power
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10. IC Design
Methodologies (Chapter 8)
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10.1 General Concepts
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10.2 Custom Circuit
Design
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10.3 Cell-based Design
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10.4 Array-based Design
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11. Testing in
Digital ICs (Insert H)
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11.1 Introduction
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11.2 Fault Types
and Models
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11.3 Design for Testability
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11.4 Test Pattern Generation
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12. Noise in Digital
Circuits (Notes)
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12.1 Introduction
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12.2 Transmission
Line Effects & Modeling
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12.3 Crosstalk
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12.4 Other Sources of Noise
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Lecture times indicated above are estimated. Actual discussion lengths will depend on multiple factors that include number of questions and interruptions during lectures, level of understanding by the students, unforeseen events, among others.
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